发明名称 PRODUCTION OF MASK FOR X-RAY ALIGNER
摘要 PURPOSE:To provide a method for producing a mask for X-ray aligner having high positional accuracy and planarity and in which the positional displacement of pattern due to production process is suppressed. CONSTITUTION:The method for producing a mask for X-ray aligner employs at least an X-ray absorptive pattern, an X-ray transmissive thin film for holding the X-ray absorptive pattern, and a supporting frame for securing the X-ray transmissive thin film on the outer periphery thereof. In order to form an X-ray absorptive pattern finally at a position separated by a distance (r) from the center of the X-ray transmissive thin film, i.e., the mask for X-ray aligner, the X-ray absorptive pattern is formed at such position as previously corrected by an amount corresponding to the displacement of the X-ray absorptive pattern caused by the inner stress of the X-ray transmissive thin film after formation of the supporting frame through etching of a supporting substrate.
申请公布号 JPH07235482(A) 申请公布日期 1995.09.05
申请号 JP19940047876 申请日期 1994.02.22
申请人 TOPPAN PRINTING CO LTD 发明人 MATSUO TADASHI;FUKUHARA NOBUHIKO;NOGUCHI FUMINOBU;TANAKA SHOJI
分类号 G03F1/22;H01L21/027 主分类号 G03F1/22
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