发明名称 Apparatus and method for fluorescent x-ray analysis of light and heavy elements
摘要 A method and apparatus for measuring fluorescent X-rays from a sample include an X-ray voltage tube having a variable applied voltage during the measurement cycle. The resulting fluorescent X-rays are measured by a detector that output representative signals. The representative signals are used to calculate a characteristic energy spectrum which can be displayed to an operator. The use of a varying voltage ensures detecting both light and heavy elements. An X-ray filter can also be inserted to prevent any characteristic X-rays from being generated from the X-ray gun itself.
申请公布号 US5428656(A) 申请公布日期 1995.06.27
申请号 US19930133575 申请日期 1993.10.08
申请人 HORIBA, LTD. 发明人 KIRA, AKIMICHI;SATO, YOSHIMICHI
分类号 G01N23/223;G01N23/22;(IPC1-7):G01N23/223 主分类号 G01N23/223
代理机构 代理人
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