发明名称 |
Apparatus and method for fluorescent x-ray analysis of light and heavy elements |
摘要 |
A method and apparatus for measuring fluorescent X-rays from a sample include an X-ray voltage tube having a variable applied voltage during the measurement cycle. The resulting fluorescent X-rays are measured by a detector that output representative signals. The representative signals are used to calculate a characteristic energy spectrum which can be displayed to an operator. The use of a varying voltage ensures detecting both light and heavy elements. An X-ray filter can also be inserted to prevent any characteristic X-rays from being generated from the X-ray gun itself.
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申请公布号 |
US5428656(A) |
申请公布日期 |
1995.06.27 |
申请号 |
US19930133575 |
申请日期 |
1993.10.08 |
申请人 |
HORIBA, LTD. |
发明人 |
KIRA, AKIMICHI;SATO, YOSHIMICHI |
分类号 |
G01N23/223;G01N23/22;(IPC1-7):G01N23/223 |
主分类号 |
G01N23/223 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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