发明名称 Procedure and apparatus for the absolute measurement of the geometrical or optical structure of an optical component.
摘要 <p>The invention relates to a method for absolute measurement of the geometrical or optical structure of an optical component (4), comprising steps consisting in: - illuminating the said optical component with incident light, the wavefront of which is known, - measuring, in a given plane, the maps of the slopes of the wavefront of the said light after reflection from the said optical component or transmission by the said optical component, which furthermore comprises at least one calculation procedure consisting in deducing the geometrical or optical structure of the optical component from the said measurement of the slope maps. A further subject of the invention is a device for implementing this method. The invention is applied in particular in the field of ophthalmology for checking or measuring ophthalmic lenses or moulds for fabricating ophthalmic lenses. &lt;IMAGE&gt;</p>
申请公布号 EP0644411(A1) 申请公布日期 1995.03.22
申请号 EP19940401959 申请日期 1994.09.02
申请人 ESSILOR INTERNATIONAL (COMPAGNIE GENERALE D'OPTIQUE) 发明人 LE SAUX, GILLES;BERTRAND, PATRICK;LIPPENS, XAVIER;LAFAY, CHRISTOPHE
分类号 G01B11/24;G01B11/255;G01M11/00;G01M11/02;(IPC1-7):G01M11/02 主分类号 G01B11/24
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