发明名称 SEMICONDUCTOR MEMORY AND MANUFACTURE THEREOF
摘要 PURPOSE:To provide a stacked capacitor-type DRAM cell whose memory capacity can be increased with its area being made small on the substrate. CONSTITUTION:This DRAM cell is constituted of a substrate 11, diffusion layers 12, 13, an interlayer insulating film 14, gates (word lines) 15, 20 which are formed of a polysilicon film, a lower capacitor electrode 16 which is formed of polysilicon films 32, 33, a thin film 17 of a large permittivity, an upper capacitor electrode 18 formed of a polysilicon film, a field oxide film 19, an insulating film 21, and a bit line 22. If the polysilicon film 32 is formed thick and an area of an external edge section (A section) of the polysilicon film 16 is increased, a surface area of the thin film 17 is increased. If the polysilicon film 32 is formed thick, a central dent of the polysilicon film 16 becomes deep and then a surface area of the thick film 17 is increased. By this method, a memory capacity can be increased.
申请公布号 JPH06310672(A) 申请公布日期 1994.11.04
申请号 JP19930099777 申请日期 1993.04.26
申请人 SANYO ELECTRIC CO LTD 发明人 NAGASAWA HIDEJI;HONMA KAZUYA;TAKEDA YASUHIRO;YONEDA KIYOSHI
分类号 H01L27/04;H01L21/822;H01L21/8242;H01L27/10;H01L27/108 主分类号 H01L27/04
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