Test card system for testing integrated circuits with interchangeable pin wheel and optional interchangeable wiring/electronics

摘要

With the invention a test card system for testing integrated circuits is provided, which system produces the connection from a test device to the lands of the integrated circuit. For this purpose, the test card system has a pin wheel 2, 3 which has contact needles 15 which can be placed in contact with the lands and are connected to first contact elements 8; furthermore, the test card system according to the invention has a base card 1 which has a receiving device 6 for receiving the pin wheel 2, 3 and two contact elements 14 which produce the electrical connection to the first contact elements 8 of the received pin wheel 2, 3, the second contact elements 14 of the base card being capable of being connected to the test device so that different pin wheels 2, 3 can be used with the base card 1. The said base card 1 can, moreover, be finished in such a way that it can receive additional elements 4, 5 which are electrically connected between the second contact elements 14 and the test device. <IMAGE>