PROBE SCANNING TYPE MICROSCOPE,申请号JP19930008309-传众专利搜索

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发明名称	PROBE SCANNING TYPE MICROSCOPE
摘要
申请公布号	JPH06213655(A)	申请公布日期	1994.08.05
申请号	JP19930008309	申请日期	1993.01.21
申请人	YOKOGAWA ELECTRIC CORP	发明人	NANKO TOMOAKI
分类号	G01B21/30;G01Q10/02;G01Q10/06;G01Q60/24;H01J37/28;(IPC1-7):G01B21/30	主分类号	G01B21/30
代理机构		代理人
主权项
地址

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