发明名称 Method for forming a patterned resist
摘要 After a resist layer is formed on a substrate, a predetermined region of resist layer is exposed. A silylated layer is formed in the exposed region of resist layer. After the silylation, a part but not all of the unexposed portion of the resist layer is etched to expose a nonsilylated side portion of the exposed region. The non-silylated side portion of the exposed region uncovered by etching is then silylated. The remainder of the unexposed region is removed, so that a resist pattern is finally obtained. According to the method, a fine resist pattern can be formed without side etch.
申请公布号 US5322764(A) 申请公布日期 1994.06.21
申请号 US19920882220 申请日期 1992.05.13
申请人 MITSUBISHI DENKI KABUSHIKI KAISHA 发明人 KAMIYAMA, KINYA;FIJINO, TAKESHI
分类号 G03F7/26;G03F7/40;(IPC1-7):G03C5/00 主分类号 G03F7/26
代理机构 代理人
主权项
地址