发明名称 |
Method for forming a patterned resist |
摘要 |
After a resist layer is formed on a substrate, a predetermined region of resist layer is exposed. A silylated layer is formed in the exposed region of resist layer. After the silylation, a part but not all of the unexposed portion of the resist layer is etched to expose a nonsilylated side portion of the exposed region. The non-silylated side portion of the exposed region uncovered by etching is then silylated. The remainder of the unexposed region is removed, so that a resist pattern is finally obtained. According to the method, a fine resist pattern can be formed without side etch.
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申请公布号 |
US5322764(A) |
申请公布日期 |
1994.06.21 |
申请号 |
US19920882220 |
申请日期 |
1992.05.13 |
申请人 |
MITSUBISHI DENKI KABUSHIKI KAISHA |
发明人 |
KAMIYAMA, KINYA;FIJINO, TAKESHI |
分类号 |
G03F7/26;G03F7/40;(IPC1-7):G03C5/00 |
主分类号 |
G03F7/26 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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