发明名称 DEFECT DETECTOR
摘要 PURPOSE:To classify distinct surface abnormalities due to carbide on inspected materials or due to water drops to allow the detection of only specific surface abnormalities as defects. CONSTITUTION:A defect detector 10 comprises the defect detecting part 12 which consists of a reference value setting means 31 for signals, a non-constancy detecting means 32 to detect the non-constancy of the surface based on a shift from a reference value, a polarity judging means 33 for the reference value, a polarity information holding means 34 to hold polarity information and an abnormality classifying means 35 to classify surface abnormalities in accordance with the polarity information.
申请公布号 JPH06118005(A) 申请公布日期 1994.04.28
申请号 JP19920265813 申请日期 1992.10.05
申请人 SEKISUI CHEM CO LTD 发明人 UNNO MASAYUKI
分类号 G01N21/93;G01N21/88;G01N21/94;G01N21/952;G06T1/00 主分类号 G01N21/93
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