BURN-IN TEST METHOD FOR BARE CHIP IC,申请号JP19920144120-传众专利搜索

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发明名称	BURN-IN TEST METHOD FOR BARE CHIP IC
摘要
申请公布号	JPH05340995(A)	申请公布日期	1993.12.24
申请号	JP19920144120	申请日期	1992.06.04
申请人	TOSHIBA CORP	发明人	OMORI JUN;AOKI HIDEO
分类号	G01R31/26;H01L21/66;(IPC1-7):G01R31/26	主分类号	G01R31/26
代理机构		代理人
主权项
地址

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