Semiconductor device with test-only leads

摘要

A semiconductor device (10) includes test-only leads (20) and operational leads (18). Operational leads (18) provide access to portions of a semiconductor die (12) needed for device operation. Test-only leads (20) provide access to portions of die (12) which are not needed for device operation, but which are needed during manufacturing tests. Operational leads (18) have an external configuration which facilitates attachment to a user substrate. Test-only leads (20) have an external configuration which enables electrical access to the device for test purposes; however, the test-only lead configuration makes attachment to the user substrate difficult. Since the test-only leads (20) and the operational leads (18) have two different external lead configurations, overall lead pitch is reduced, enabling device (10) to be made very small. Yet, complexity of mounting device (10) to a user substrate is not increased since the pitch between adjacent operational leads (18) can be made larger than the overall lead pitch.