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发明名称
DEFECT INSPECTING DEVICE
摘要
申请公布号
JPH05188008(A)
申请公布日期
1993.07.27
申请号
JP19920005136
申请日期
1992.01.14
申请人
NTN CORP
发明人
YAMANAKA AKIHIRO
分类号
G01B11/24;G01N21/88;G01N21/94;G01N21/956
主分类号
G01B11/24
代理机构
代理人
主权项
地址
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