发明名称 |
Manufacturing method of hyperfrequency field effect transistors. |
摘要 |
<p>A power transistor includes at least two semi-conductor layers (2.3) and two metallisations, source (4) and drain (5). A pit or drain recess (26) is made after the gate recess (14), deposition of the T gate (15) and partial masking with a dielectric (17), using the gate (15) as mask. Thus, the drain-side etching entails no source-side etching. Application to power transistors, for which the VDS is high. <IMAGE></p> |
申请公布号 |
EP0550317(A1) |
申请公布日期 |
1993.07.07 |
申请号 |
EP19920403488 |
申请日期 |
1992.12.21 |
申请人 |
THOMSON COMPOSANTS MICROONDES |
发明人 |
PACOU, THIERRY;ARSENE-HENRY, PATRICE;PHAM, NGU TUNG;AUBAME, EVELYNE |
分类号 |
H01L21/285;H01L21/338;H01L29/812 |
主分类号 |
H01L21/285 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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