发明名称 Compound semiconductor device and production method therefor.
摘要 <p>A compound semiconductor device includes a plurality of compound semiconductor epitaxially grown layers including an InGaAs layer as the uppermost layer, disposed on a semi-insulating compound semiconductor substrate; a recess groove penetrating through prescribed layers of the compound semiconductor layers at least including the InGaAs layer; insulating side walls disposed on the side surfaces of the recess groove, whose upper end parts extend outside the recess groove; a gate electrode deposited on the bottom of the recess groove and the internal surfaces of the insulating side walls; and source and drain electrodes deposited on the InGaAs layer at opposite sides of the recess groove self-alignedly with the upper ends of the insulating side walls. &lt;IMAGE&gt;</p>
申请公布号 EP0539688(A2) 申请公布日期 1993.05.05
申请号 EP19920114669 申请日期 1992.08.27
申请人 MITSUBISHI DENKI KABUSHIKI KAISHA 发明人 KOHNO, YASUTAKA
分类号 H01L29/812;H01L21/285;H01L21/335;H01L21/338;H01L29/778;(IPC1-7):H01L21/338 主分类号 H01L29/812
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