发明名称 |
Compound semiconductor device and production method therefor. |
摘要 |
<p>A compound semiconductor device includes a plurality of compound semiconductor epitaxially grown layers including an InGaAs layer as the uppermost layer, disposed on a semi-insulating compound semiconductor substrate; a recess groove penetrating through prescribed layers of the compound semiconductor layers at least including the InGaAs layer; insulating side walls disposed on the side surfaces of the recess groove, whose upper end parts extend outside the recess groove; a gate electrode deposited on the bottom of the recess groove and the internal surfaces of the insulating side walls; and source and drain electrodes deposited on the InGaAs layer at opposite sides of the recess groove self-alignedly with the upper ends of the insulating side walls. <IMAGE></p> |
申请公布号 |
EP0539688(A2) |
申请公布日期 |
1993.05.05 |
申请号 |
EP19920114669 |
申请日期 |
1992.08.27 |
申请人 |
MITSUBISHI DENKI KABUSHIKI KAISHA |
发明人 |
KOHNO, YASUTAKA |
分类号 |
H01L29/812;H01L21/285;H01L21/335;H01L21/338;H01L29/778;(IPC1-7):H01L21/338 |
主分类号 |
H01L29/812 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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