| 摘要 |
PURPOSE:To precisely and easily separate peaks (waveforms) during fluorescent X-ray spectroscopy. CONSTITUTION:Plural kinds of fluorescent X-ray spectra are obtained by measuring fluorescent X-rays from plural kinds of reference samples each made of a single element or compound and are used as reference waveforms Gj(xx) in Figure 1(b). Each modified waveform alphajGj(Xi+betaj obtained by modifying the reference waveforms G using the intensity ratio (Figure 1 (d)) of a peak to a reference waveform and the amount of deviation betaj of the spectral angle of the peak with respect to the reference waveform Gj(xj) is computed such that a synthetic waveform obtained by synthesizing each modified waveform alphaGj(xi+betaj) and the waveform B(xi) of background components coincides with the measured waveform F(xi) of the fluorescent X-ray spectrum in Figure 1(a) measured from a sample. Each modified waveform alphajGj(xi+betaj)is separated as the peak of each element.
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