发明名称 Driver circuit for circuit tester
摘要 A driver circuit for use in a circuit board tester performs both functional and in-circuit tests on a given device under test (DUT). The tester provides a control signal representative of a command for the driver circuit to provide test signals to the DUT. The driver circuit incorporates two stages: a pre-driver stage and a driver stage. The pre-driver stage consists of an amplifier connected to fast switching transistors with the ability to move in and out of saturation rapidly. The amplifier receives control signals and the switching transistors provide actuation signals to the driver stage. The driver stage comprises two emitter follower transistors that operate exclusively in an unsaturated state. The driver stage provides test signals to the DUT in response to the actuation signals from the two switching transistors of the pre-driver stage. Additionally, the driver circuit may be programmed to change the output voltage amplitudes of the test signals.
申请公布号 US5184029(A) 申请公布日期 1993.02.02
申请号 US19910776108 申请日期 1991.10.15
申请人 HEWLETT-PACKARD COMPANY 发明人 KING, PHILIP N.
分类号 G01R31/319;H03K17/66 主分类号 G01R31/319
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