发明名称 METHOD OF JOINING THIN FILM UNIT
摘要 <p>PURPOSE:To form a board even including many thin film wiring layers with the high yield in a short time by heating and bonding electrodes each comprising thin film metal at a temperature lower than the glass transition point of a polyimide resin film. CONSTITUTION:An Au bump 16 is formed on the surface of a connection pad 15 of a thin film unit 14 composed of a Cu wiring 12 and a polyimide insulating film 13 both formed on a tentative board 11. Then, after stamping of a bump 16 there are subjected to thermocompression bonding a ceramic board 20 including a metallized layer 18 and an internal layer wiring 19, and a thin film unit 14. For heating temperature at that time there is selected a temperature lower than a glass transition point of the polyimide insulating film 13, say 280. After the tentative board 11 is etched and removed, a surface layer 21 is formed. Further, an LSI 23 is mounted using a solder bump 22 to yield a predetermined mounting board 24.</p>
申请公布号 JPH04291993(A) 申请公布日期 1992.10.16
申请号 JP19910057107 申请日期 1991.03.20
申请人 HITACHI LTD 发明人 MIURA OSAMU;MIYAZAKI KUNIO;WATANABE RYUJI;OGOSHI YUKIO;SATSUU YUUICHI;SHIODA KATSUHIKO;SUZUKI HITOSHI
分类号 H05K3/36;H01L23/12;H05K1/00;H05K1/14;H05K3/46 主分类号 H05K3/36
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