发明名称 PATTERN INSPECTING DEVICE
摘要 PURPOSE:To unnecessitate a nondefective pattern as a comparison, and to unnecessitate a huge hardware for an accurate positioning with a comparing pattern by executing an arithmetic operation of a pattern picture and a mask picture, extracting feature points and detecting a chipping. CONSTITUTION:A center mask subtraction circuit 1 subtracts the picture of a center mask from the inputted picture and outputs a subtraction picture signal (i). A feature point extracting circuit 2 inputs the subtraction picture signal (i), and after executing a line thinning process to the inputted subtraction picture, detects end points and outputs a feature point signal (j). And a peripheral mask confirming circuit 3 outputs a binary picture signal (h) and the feature point signal (j), and confirms the true and false of end points T1 and T2 detected in the feature point detecting circuit 2 as candidate points indicating the chipping of the pattern of a pad, then outputs a chipping detection signal (k). Thus, the nondefective pattern for the comparison is unnecessitated, and the huge software for the accurate positioning with the comparing pattern is unnecessitated.
申请公布号 JPH04148280(A) 申请公布日期 1992.05.21
申请号 JP19900269824 申请日期 1990.10.08
申请人 NEC CORP 发明人 TAGA HINAKO
分类号 G01N21/88;G01N21/956;G06T1/00;G06T7/00;H05K3/00 主分类号 G01N21/88
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