MEETINRICHTING VOORZIEN VAN EEN VELDEFFEKTTRANSISTOR VOOR HET METEN VAN EEN DE GELEIDING IN HET KANAAL VAN DE VELDEFFEKTTRANSISTOR BEINVLOEDENDE UITWENDIGE GROOTHEID.

摘要

A device for measuring a quantity which influences a field-effect transistor which is included in a measuring circuit as a variable resistance. To compensate for temperature-dependent changes of the field-effect transistor, an auxiliary signal, having a frequency located outside the frequency range of the quantity to be measured, is applied to the transistor. The two signals are separated from one another again after having been processed by the measuring circuit.