| 摘要 |
PURPOSE: To dynamically observe a digital bus between integrated circuits by providing a test circuit where data is stored in response to a prescribed state at the time when a device connected to an input circuit is in the function mode. CONSTITUTION: Each of digital bus monitors DBM 20 and 22 is provided with a test cell register control circuit 26, a test cell register 28, a memory buffer 30, an event condition module EQM 32, a bypass register 34, a command register 36, and a test port 38. DBMs 20 and 22 are connected between two integrated circuits 10 and 12 and use EQMs 32 to continuously monitor data and address busses 14 and 16. Thus, data on the bus connecting many integrated circuits can be monitored. |
