| 摘要 |
A sampling probe for optical analyzation of a sample includes an MIR element having a cylindrical body with a flat end and a curved end. The flat end and the adjacent active portion of the body is positioned against the sample, and the curved end is operative to receive and emit radiant energy internally multiply reflected in both directions along the MIR element to optically analyze the sample. For high pressure and/or high temperature applications, the MIR element is preferably a crystal partially mounted in and sealed to a holder, which in turn is mounted in and sealed to one wall of a fluid or reaction chamber. The crystal or adjacent holder surface is coated or mirrored to enhance optical efficiency, and the crystal is secured within and sealed to the holder by soldering, an adhesive bond or a prestressed friction fit. The sampling probe includes an optical system having a radiant energy beam splitter and inlet and egress optics for the MIR element, the inlet and egress optics being selected from reflaxicon optics, an objective lens, cooperative mirror pairs or spherical or ashperical optics.
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