| 发明名称 |
DEVICE FOR DETERMINING THE PARAMETERS OF DEVELOPING SURFACE CRACKS. |
| 摘要 |
<p>A device for measuring the parameters of developing surface cracks comprises a sensitive element (1) applied to a dielectric sublayer (2) at the point of expected development of a surface crack (11) and comprised of a number of conductors (4', 4'', ... 4<n>), and further comprises a measuring circuit (3) electrically connected to the sensitive element (1) in which the ends of the conductors (4', 4'', ... 4<n>) are electrically interconnected in series by their main bridges (5', 5'', ... 5<n-1>), the sensitive element being also provided with additional bridges (6', 6'', ... 6<n-1>) each of which is located opposite a main bridge (5', 5'', ... 5<n-1>).</p> |
| 申请公布号 |
EP0414924(A1) |
申请公布日期 |
1991.03.06 |
| 申请号 |
EP19900911921 |
申请日期 |
1989.02.28 |
| 申请人 |
INSTITUT ELEKTROSVARKI IMENI E.O.PATONA AKADEMII NAUK UKRAINSKOI SSR;MOSKOVSKOE NAUCHNO-PROIZVODSTVENNOE OBIEDINENIE "IZMERITEL";KIEVSKOE PROIZVODSTVENNOE OBIEDINENIE "VEDA" |
发明人 |
GORDEEVA, FAINA ALEXANDROVNA;ALEXEEV, ALEXANDR IVANOVICH;TSYKUNOV, NIKOLAI VALENTINOVICH;KHRAKOVSKY, ALEXANDR IOSIFOVICH;KUZNETSOVA, LIDIA STEPANOVNA;SYROV, ALEXANDR VIKTOROVICH;BEBISHEV, ANATOLY KUZMICH;LEBEDEV, VLADIMIR KIRILLOVICH;FEDKO, BORIS ANANTOLIEVICH;BAZZHIN,JURY MIKHAILOVICH |
| 分类号 |
G01B7/14;G01B7/16;G01N27/20 |
主分类号 |
G01B7/14 |
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