| 摘要 |
PURPOSE:To improve horizontal deflection accuracy to an electron beam in any environment by correcting the horizontal deflection state of the electron beam with linear correction data to the horizontal deflecting coil current of a cathode-ray tube. CONSTITUTION:A line pattern generation part 12 generates a correction pattern 12a on the screen 11a of the cathode-ray tube(CRT) 11 and a pattern detection part 13 detects it in order to improve the linearity of horizontal deflecting operation upon the electron beam. Pattern data detected by this pattern detection part 13 is compared with reference pattern data stored in a reference pattern data storage part 16 to obtain difference data and the horizontal deflection state of the electron beam is controlled with the correction data based upon the difference data. Thus, the horizontal deflection accuracy to the electron beam can be improved in any environment. |
