发明名称 |
SEMICONDUCTOR DEVICE HAVING A MULTI-LAYERED WIRING STRUCTURE |
摘要 |
A semiconductor device has a multi-layered wiring structure. This semiconductor device has an interlayer insulating film comprising a first insulating film (4) for protecting a first metal wiring layer (3a), a second insulating film (5) deposited on the first insulating film (4) by a substrate-bias applying method to flatten the interlayer insulating film and a third insulating film (6) deposited on the second insulating film (5) to improve the productivity by the same method as used to form the first insulating film (4). |
申请公布号 |
EP0365854(A3) |
申请公布日期 |
1990.12.05 |
申请号 |
EP19890117848 |
申请日期 |
1989.09.27 |
申请人 |
KABUSHIKI KAISHA TOSHIBA |
发明人 |
KATSURA, TOSHIHIKO;ABE, MASAHIRO;MASE, YASUKAZU |
分类号 |
H01L21/768;H01L21/31;H01L23/532;(IPC1-7):H01L23/522 |
主分类号 |
H01L21/768 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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