发明名称 SEMICONDUCTOR DEVICE HAVING A MULTI-LAYERED WIRING STRUCTURE
摘要 A semiconductor device has a multi-layered wiring structure. This semiconductor device has an interlayer insulating film comprising a first insulating film (4) for protecting a first metal wiring layer (3a), a second insulating film (5) deposited on the first insulating film (4) by a substrate-bias applying method to flatten the interlayer insulating film and a third insulating film (6) deposited on the second insulating film (5) to improve the productivity by the same method as used to form the first insulating film (4).
申请公布号 EP0365854(A3) 申请公布日期 1990.12.05
申请号 EP19890117848 申请日期 1989.09.27
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 KATSURA, TOSHIHIKO;ABE, MASAHIRO;MASE, YASUKAZU
分类号 H01L21/768;H01L21/31;H01L23/532;(IPC1-7):H01L23/522 主分类号 H01L21/768
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