| 摘要 |
PURPOSE:To measure the propagation of thermal waves with high accuracy by detecting the displacement of a sample surface arising from the propagation of the thermal wave as a change of a tunnel current or interatomic force by means of a probe disposed on the sample surface without contact therewith. CONSTITUTION:The thermal wave SW is generated on and in the sample 8 surface when an impulsive energy wave irradiating body 10 constituted of a beam splitter 4, a 1st condenser lens 5, a 2nd condenser lens 6 and a photographing device 7 irradiates the sample surface with impulsive energy pulses. This wave propagates in the sample and a high-temp. region is locally formed in the sample 8. The sample 8 expands in this region and the interatomic distance increases. The propagation of the SW appears as a surface displacement and the wave propagates in the sample 8 surface. The distance between the probe 16 disposed near the surface of the sample 8 and the sample 8 surface changes at this time and the tunnel current passed between the probe 16 and the sample 8 changes in proportion thereto and, therefore, this change is detected and the way of the SW propagation in the sample 8 surface is measured. The detection of the displacement of the sample 8 surface as the interatomic force received by the probe 16 is possible as well. |
