HANDLER FOR INTEGRATED CIRCUIT DEVICE TESTER AND ITS HANDLING METHOD,申请号JP19890029636-传众专利搜索

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发明名称	HANDLER FOR INTEGRATED CIRCUIT DEVICE TESTER AND ITS HANDLING METHOD
摘要
申请公布号	JPH02210274(A)	申请公布日期	1990.08.21
申请号	JP19890029636	申请日期	1989.02.10
申请人	OKI ELECTRIC IND CO LTD;MIYAZAKI OKI ELECTRIC CO LTD;YOSHIKAWA SEMICONDUCTOR KK;YOSHIKAWA KOGYO CO LTD	发明人	WATANABE TAKAOMI;IWAYAMA KEIICHI;NAKAGAWA MASAHITO;NAKAMURA YOSHIKAZU
分类号	G01R31/26;G01R31/00	主分类号	G01R31/26
代理机构		代理人
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