发明名称 |
Plasma doping process and apparatus therefor |
摘要 |
In a plasma doping process utilizing a radio frequency discharging in a vacuum by for doping an impurity into a semiconductor substrate, the radio frequency discharging is made intermittently and under controlling of average current of the discharging, thereby the impurity concentration is desirably controlled; and especially by selecting the vacuum in a range between 1x10-4-5x10-2 torr, undesirable deposition of the impurity on the substrate surface is evadable.
|
申请公布号 |
US4937205(A) |
申请公布日期 |
1990.06.26 |
申请号 |
US19880228216 |
申请日期 |
1988.08.04 |
申请人 |
MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD. |
发明人 |
NAKAYAMA, ICHIRO;MIZUNO, BUNJI;KUBOTA, MASABUMI;TANNO, MASUO |
分类号 |
H01L21/223 |
主分类号 |
H01L21/223 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|