发明名称 Plasma doping process and apparatus therefor
摘要 In a plasma doping process utilizing a radio frequency discharging in a vacuum by for doping an impurity into a semiconductor substrate, the radio frequency discharging is made intermittently and under controlling of average current of the discharging, thereby the impurity concentration is desirably controlled; and especially by selecting the vacuum in a range between 1x10-4-5x10-2 torr, undesirable deposition of the impurity on the substrate surface is evadable.
申请公布号 US4937205(A) 申请公布日期 1990.06.26
申请号 US19880228216 申请日期 1988.08.04
申请人 MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD. 发明人 NAKAYAMA, ICHIRO;MIZUNO, BUNJI;KUBOTA, MASABUMI;TANNO, MASUO
分类号 H01L21/223 主分类号 H01L21/223
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