Control sequencer with dual microprogram counters for microdiagnostics
摘要
A microprogrammed control unit of an information processing system having a control sequencer with dual microprogram counters for performing microdiagnostics simultaneously with performing macroprograms. The microdiagnostics comprise background and operability tests, the background tests being interleaved with macroinstruction operations under the control of the two independent microprogam counters. The background tests are run during processor idle time and the operability tests are executed at processor turn-on. The organization of the microdiagnostics into a hierarchical structure allows the use of the same microprogrammed test module for both the background and operability microdiagnostic tests. A prediction/residual coding technique provides fault detection for address and data information within the control sequencer.
申请公布号
US4841434(A)
申请公布日期
1989.06.20
申请号
US19870042560
申请日期
1987.04.27
申请人
RAYTHEON COMPANY
发明人
MATHEWES, JR., JAMES K.;HERMAM, JAN S.;JOHNSON, STEPHEN C.;GOUD, RICHARD B.;STIFFLER, JACK J.