发明名称 GEDAEMPFTES CHEMISCHES DAMPFNIEDERSCHLAGSVERFAHREN GLATTER DOTIERTER FILME.
摘要 A method of fabricating a film of in-situ doped polycrystalline silicon having a surface that is free of microscopic hillocks includes the steps of providing a deposition chamber and a wafer therein on which the film is to be fabricated and introducing one gas containing silicon atoms and another gas containing dopant atoms into said chamber with respective flow rates; wherein the respective flow rates are gradually increased in an overdamped fashion over a start-up time interval of at least one minute from zero to respective steady state values while simultaneously the ratio of the respective flow rates is kept within 25% of the ratio of said steady state values.
申请公布号 AT42429(T) 申请公布日期 1989.05.15
申请号 AT19840900354T 申请日期 1983.12.14
申请人 UNISYS CORPORATION 发明人 WONSOWICZ, CASIMIR, JOHN
分类号 D01F9/08;C23C16/24;C23C16/44;C23C16/52;H01L21/18;H01L21/205;H01L21/225;H01L21/3205;(IPC1-7):H01L21/18 主分类号 D01F9/08
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