发明名称 Grown side-wall silicided source/drain self-align CMOS fabrication process
摘要 A process for forming CMOS devices uses outdiffusion of implanted ions in a patterned refractory silicidable layer to form the source/drain regions of the device. Moreover, the oxidation of the sidewalls of openings formed in the layer serves to isolate the layer from the polysilicon gate electrode which is later formed in the openings in this layer.
申请公布号 US4764481(A) 申请公布日期 1988.08.16
申请号 US19870088238 申请日期 1987.08.24
申请人 DELCO ELECTRONICS CORPORATION 发明人 ALVI, NADEEM S.;STEVENSON, PAUL E.
分类号 H01L21/225;H01L21/60;H01L21/8238;(IPC1-7):H01L21/225 主分类号 H01L21/225
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