发明名称 |
SYSTEM AND APPARATUS FOR SAMPLING DETECTION SIGNAL OF SURFACE PLATE DEFECT |
摘要 |
PURPOSE:To select and output a data of max. value in each cell by obtaining a defect detection signal of a face plate scanned by a scan line with circular arcs linked gradually at a fixed pitch. CONSTITUTION:A laser spot 1 herein used is oval with the long-axis radius sized DELTAr and a face plate 2 is divided into P areas of equal angle phicircumferentially and moves along the radius of the face plate 2 by one-Pth of DELTAr starting at the rotation center 0 of the face plate 2 each time it turns by an angle phi so that circular arcs are linked gradually at a pitch of DELTAr per turn. With this scanning, a measuring signal of an analog value continued as obtained by a defect detecting section is sampled by a sampling pulse (s). Then, each of the circular arcs by this scanning is divided by the length DELTAl, almost equal to the radius DELTAr of the spot 1 while being integer (n) times as much as a distance interval DELTAs of a pulse (s), to make cells. Max. value in the measurement data obtained by sampling for each cell is compared and selected to be outputted.
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申请公布号 |
JPS63122936(A) |
申请公布日期 |
1988.05.26 |
申请号 |
JP19860270491 |
申请日期 |
1986.11.13 |
申请人 |
HITACHI ELECTRONICS ENG CO LTD |
发明人 |
TSUZUKI HIROSHI;HONDA MASASHI;HASEGAWA TADASHI |
分类号 |
H01L21/66;G01N21/88;G01N21/95;G01N21/956 |
主分类号 |
H01L21/66 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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