发明名称 SYSTEM AND APPARATUS FOR SAMPLING DETECTION SIGNAL OF SURFACE PLATE DEFECT
摘要 PURPOSE:To select and output a data of max. value in each cell by obtaining a defect detection signal of a face plate scanned by a scan line with circular arcs linked gradually at a fixed pitch. CONSTITUTION:A laser spot 1 herein used is oval with the long-axis radius sized DELTAr and a face plate 2 is divided into P areas of equal angle phicircumferentially and moves along the radius of the face plate 2 by one-Pth of DELTAr starting at the rotation center 0 of the face plate 2 each time it turns by an angle phi so that circular arcs are linked gradually at a pitch of DELTAr per turn. With this scanning, a measuring signal of an analog value continued as obtained by a defect detecting section is sampled by a sampling pulse (s). Then, each of the circular arcs by this scanning is divided by the length DELTAl, almost equal to the radius DELTAr of the spot 1 while being integer (n) times as much as a distance interval DELTAs of a pulse (s), to make cells. Max. value in the measurement data obtained by sampling for each cell is compared and selected to be outputted.
申请公布号 JPS63122936(A) 申请公布日期 1988.05.26
申请号 JP19860270491 申请日期 1986.11.13
申请人 HITACHI ELECTRONICS ENG CO LTD 发明人 TSUZUKI HIROSHI;HONDA MASASHI;HASEGAWA TADASHI
分类号 H01L21/66;G01N21/88;G01N21/95;G01N21/956 主分类号 H01L21/66
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