| 摘要 |
<p>PURPOSE:To enable the measuring of absolute reflection factor directly and without disturbance disregarding even a slight curve of a sample surface varying the angle of incidence continuously, by setting an integrating sphere at the tip of a rotary arm with the sample surface positioned at the center of a rotating section of a goniometer. CONSTITUTION:An integrating sphere K is place at the position of 180 deg. on a goniometer with the setting of no sample S so that light emitted from a spectroscope 5 is incident directly on the integrating sphere K and an output of a photoelectric multiplier tube 3 is taken into a data processor 11. Then, a sample S is set with the surface thereof positioned on the center line of rotation of a rotary base 1 so that the surface of the sample is parallel with the emission light of the spectroscope when the rotary base 1 is at an angular position of 90 deg. on the goniometer. Then, as the rotary base 1 is turned to a desired angular position theta, the rotary arm 2 takes a position of 2theta. In this manner, the emission light of the spectoscope 5 is reflected on the sample surface to be incident on the integrating sphere K, when the output of the multiplier tube 3 is taken into the processor 11. Finally, absolute spectroscopic reflection factor on the surface of the sample S can be determined by performing a specified computation with the device 11.</p> |
