发明名称 MANUFACTURE OF FILM
摘要 PURPOSE:To form a uniform film on a substrate having a large area by a method wherein the high frequency power, to be applied between electrodes when a plasma vapor-phase reaction is performed, is applied after it has been AM-modulated. CONSTITUTION:The high frequency power, to be applied between the upper and the lower paralleled flat plate electrodes 21 and 21, is amplitudemodulated, its frequency is once in 1-5 seconds, the maximum degree of modulation is 50%, and when the degree of modulation is made larger than the above, the discharge of plasma is not uniform and it becomes instable, because the interval between the upper and the lower electrodes 21 and 21 is spaced widely. Thus, when the high frequency power to be applied is AM-modulated and it is applied between the upper and the lower electrodes 21 and 21, the film-forming condition on a substrate 25 is brought into the state of regions I, II and III alternately as shown in the diagram, and the film thickness distribution on the substrate 25 can be brought into the uniform film thickness distribution as a result. Through these procedures, the film having a uniform film thickness distribution can be formed on the substrate of a large area.
申请公布号 JPS6342115(A) 申请公布日期 1988.02.23
申请号 JP19860186203 申请日期 1986.08.08
申请人 SEMICONDUCTOR ENERGY LAB CO LTD 发明人 SUZUKI KUNIO;FUKADA TAKESHI;KANEHANA MIKIO;ABE MASAYOSHI;SHIBATA KATSUHIKO;USUDA MASATO;ISHIDA NORIYA;SATAKE AKEMI;ARAI YASUYUKI
分类号 H01L31/04;C23C16/24;C23C16/50;C23C16/509;C23C16/54;H01J37/32;H01L21/205 主分类号 H01L31/04
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