发明名称 Contacts formed in minimum surface area of semiconductor devices.
摘要 <p>A technique for providing a contact to regions of a substrate (12) using a minimun of substrate surface (13) area by anisotropically etching a vertical trench (30) exposing silicon for preferential deposit of conductive material (40), such as tungsten, to form a contact.</p>
申请公布号 EP0255973(A2) 申请公布日期 1988.02.17
申请号 EP19870201420 申请日期 1987.07.23
申请人 SILICONIX INCORPORATED 发明人 BLANCHARD, RICHARD A.
分类号 H01L21/285;H01L21/336;H01L21/74;H01L29/41;H01L29/78;(IPC1-7):H01L29/52 主分类号 H01L21/285
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