| 摘要 |
<p>An electrical test probe in which spring biasing of the probe plunger is provided by the cooperative action of one or more laterally deflectable spring fingers cooperative with one or more angled surfaces. The plunger (18) includes ramped surfaces (16) which are cooperative with spring fingers (14) of a spring assembly, which are laterally movable to urge the plunger to a normally outward position. Alternatively, the spring assembly can be part of the movable plunger with the ramped surface or surfaces being fixed. The spring probe can be contained within a sleeve (1) or can be mounted directly within an opening of a circuit board or other mounting member. </p> |
