发明名称 Plasma ion deposition process
摘要 A plasma ion deposition process of large-grain, thin semiconductor films directly on low-cost amorphous substrates comprising ionizing a semiconductor-based gaseous compound in a chamber by an electron-supported large volume, low pressure, high temperature plasma. The semiconductor ions are extracted from the compound and are deposited on the substrate. Preferably, the deposition is effected first at a slow deposition rate, followed by a higher deposition rate. The deposited ions are permitted to coalesce into lattice clusters, which clusters are grown, by further deposition, into a large-grain, thin semiconductor film on the substrate. Preferably, the semiconductor-based gaseous compound includes silane gas with dopant atom source gases.
申请公布号 US4443488(A) 申请公布日期 1984.04.17
申请号 US19810312712 申请日期 1981.10.19
申请人 SPIRE CORPORATION 发明人 LITTLE, ROGER G.;WOLFSON, ROBERT G.;SOLOMON, STANLEY J.
分类号 C23C16/503;C30B25/10;H01L21/205;(IPC1-7):B05D3/06 主分类号 C23C16/503
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