| 摘要 |
PURPOSE:To reduce the required analysis time by enabling the correction of disturbing X-ray with a single X-ray spectrometer without scanning wavelength. CONSTITUTION:A wave height analyzer 4 is set at LU1 for the upper limit and LL1 for the lower limit in the window of selecting wave height and a wave height analyzer 4' at LU2 for the upper limit an LL2 for the lower limit in the window. Here, the values LU1 and LL1 are set both before and after the peak A. The peak B is in the wave length distribution of disturbing X-rays and the values LU2 and LL2 are set at a part not overlapping the pulse of the peak A. The pulse section in the X-rays of the wavelength to be measured corresponds to pulses passing the windows LU1 and LL1 of the wave height analyzer 4 excluding the shade part. The count output IB of a counter 5' corresponding to the shade part purely gives the height of the peak B, where K is constant in the relationship of iB=K.IB. When the count of a counter 5 is put at iA, this is the sum of counts IA and iB of pulses in the X-ray of the wavelength to be measured and the count IA of the pulses is given by IA=iA-K.IB. From the counting of pulses within a fixed time, the intensity of the X-ray of the intended wavelength can be measured. |
