发明名称 MANUFACTURE OF SEMICONDUCTOR ELEMENT
摘要 PURPOSE:To prevent the production of a heat crack by coating solder paste on a semiconductor wafer formed with ohmic electrodes and then heating it at a temperature higher than solder melting point, thereby forming a solder layer on the ohmic electrodes. CONSTITUTION:A metal layer 2 for an ohmic electrode is deposited on the overall semiconductor wafer 2 finished with the final diffusion step, a resist is then coated on the layer 2, is exposed and developed, thereby forming a resist pattern 3, the layer 2 between the resists 3 is etched, thereby dissolving the resist 3 to insularly form ohmic electrodes 2a. Then, solder paste 3 is coated on the surface of the wafer 1, and a solder layer 4a is formed on the electrodes 2a by heating the paste at a temperature higher than the solder melting point in atmospheric air or inert gas atmosphere.
申请公布号 JPS5864049(A) 申请公布日期 1983.04.16
申请号 JP19810162604 申请日期 1981.10.14
申请人 TOKYO SHIBAURA DENKI KK 发明人 JIMI EIJI;NAKAMURA KISAKU
分类号 H01L21/60;H01L21/52;H01L21/58 主分类号 H01L21/60
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