发明名称 |
Semiconductor memory test equipment |
摘要 |
A semiconductor memory test equipment which reads out a memory under test by an address from a pattern generator and compares the read-out data with an expected value by a comparator, and in which a block mask memory is read out by a portion of the address and the comparing operation of the comparator is inhibited by block mask data read out from the block mask memory. Pattern data for a pattern memory, which is read out by the abovesaid address to store data to be supplied to the comparator, are transferred as parallel data from a central processor and written in the pattern memory after conversion to serial data, and serial data read out from a defective address memory are inputted to the central processor after conversion to parallel data.
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申请公布号 |
US4369511(A) |
申请公布日期 |
1983.01.18 |
申请号 |
US19800205162 |
申请日期 |
1980.11.10 |
申请人 |
NIPPON TELEGRAPH & TELEPHONE PUBLIC CORP.;TAKEDA RIKEN KOGYO KABUSHIKI KAISHA |
发明人 |
KIMURA, KENJI;ISHIKAWA, KOHJI;NARUMI, NAOAKI |
分类号 |
G01R31/3193;G11C29/56;(IPC1-7):G01R31/28 |
主分类号 |
G01R31/3193 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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