| 摘要 |
PURPOSE:To decrease the defect detecting time and at the same time to improve the production yield, by detecting the defect of a selecting circuit for row/column selection line and row/column via a row line and a column selection line. CONSTITUTION:The hamming distance dR addressed to a row line is set at 1, and then a row line of a storage cell array 2 is selected by a row selecting circuit 1. Thus the row line is divided into NR (NR>=1) units of groups for the purpose of inspection for the normalcy of the above-mentioned selection, the presence or absence of an earth short and the presence or absence of a short of the contiguous row lines. Then the odd row lines are separated from the even row lines with each group. A row inspecting circuit 3 secures an NOR for the voltage state of the row line with each row line of each odd/even group of each group. As a result, an exclusive OR is secured for each group, and accordingly an exclusive OR is secured for all groups. Then this result is delivered to a terminal 7. |
