发明名称 SEMICONDUCTOR DEVICE
摘要 PURPOSE:To form a cheap passivation film having strong mechanical strength by shaping the passivation film covering the surace of a substrate in double structure, a lower layer thereof consists of a plasma nitride film and an upper layer thereof a phosphorus glass film. CONSTITUTION:The P-SiN film 4 and the PSG film 5 are successively laminated and formed onto a wiring layer 3 of the Si substrate 1 constituting a circuit element. The PSG film is removed through wet etching and the P-SiN silm through plasma etching selectively, and a window 8 for extracting an electrode is shaped. The P- SiN film takes partial charge of the mechanical strength of passivation, and the passivation film 9 formed by replacing one part of a thick film with the cheap PSG film is obtained. Accordingly, the cheap passivation film in multilayer structure having strong mechamical strength can be shaped.
申请公布号 JPS5762535(A) 申请公布日期 1982.04.15
申请号 JP19800135845 申请日期 1980.10.01
申请人 HITACHI SEISAKUSHO KK;HITACHI MAIKURO COMPUTER ENGINEERING KK 发明人 HARA YUUJI;TOTANI TATSUROU;ITOU TATSU
分类号 H01L21/768;H01L21/31;H01L21/314;H01L21/318;H01L23/522 主分类号 H01L21/768
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