发明名称 |
Glass passivated mesa diode mfr. - by forming semiconductor layers, forming furrows, depositing sipox, glass, and nickel then dicing |
摘要 |
<p>Glass passivated mesa diodes are mfd. by (a) forming a semiconductor slice having a first thick layer of first conductivity type with a high level of dopant, covered with a second layer of the same conductivity type at a low-dopant level followed by a third layer of second conductivity type; (b) forming furrows in the slice according to a pattern of elementary diodes, starting from the first layer and reaching the first; (c) forming a deposition of polycrystalline silicon doped with oxygen (Sipox) on both faces of the slice; (d) depositing particles of glass in the furrows and sintering it; (e) placing the wafer in a nickel flash plating bath to form a premetallisation localised on the Sipox layer at the places where it is not coated with glass; and (f) metallising the surfaces of the wafer and cutting it into elementary diodes. The Sipox layer improves the voltage behaviour of a diode when the temp. rises. The diodes are mfd. without using masking steps, the various layers being self aligned.</p> |
申请公布号 |
FR2487576(A1) |
申请公布日期 |
1982.01.29 |
申请号 |
FR19800016328 |
申请日期 |
1980.07.24 |
申请人 |
THOMSON CSF |
发明人 |
ANDRE PEYRE-LAVIGNE |
分类号 |
H01L21/56;H01L23/31;(IPC1-7):01L21/316;01L21/78 |
主分类号 |
H01L21/56 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|