发明名称 FIELD EFFECT TRANSISTOR STRUCTURE AND METHOD OF MAKING SAME
摘要 An improved field effect transistor structure which reduces a leakage phenomenon, termed the "sidewalk" effect, between the semiconductor substrate and a conductive silicon dioxide layer disposed over the substrate. The improvement comprises forming a layer of highly resistive, silicon dioxide or silicon oxynitride, which is between the conductive oxide and the silicon nitride layer which forms a portion of the gate insulator for the field effect transistor.
申请公布号 US4051273(A) 申请公布日期 1977.09.27
申请号 US19750635523 申请日期 1975.11.26
申请人 IBM CORPORATION 发明人 ABBAS, SHAKIR AHMED;DOCKERTY, ROBERT CHARLES
分类号 H01L21/283;H01L21/28;H01L21/314;H01L21/76;H01L21/8247;H01L29/41;H01L29/43;H01L29/51;H01L29/78;H01L29/788;H01L29/792;(IPC1-7):B05D5/12 主分类号 H01L21/283
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