发明名称 |
FIELD EFFECT TRANSISTOR STRUCTURE AND METHOD OF MAKING SAME |
摘要 |
An improved field effect transistor structure which reduces a leakage phenomenon, termed the "sidewalk" effect, between the semiconductor substrate and a conductive silicon dioxide layer disposed over the substrate. The improvement comprises forming a layer of highly resistive, silicon dioxide or silicon oxynitride, which is between the conductive oxide and the silicon nitride layer which forms a portion of the gate insulator for the field effect transistor.
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申请公布号 |
US4051273(A) |
申请公布日期 |
1977.09.27 |
申请号 |
US19750635523 |
申请日期 |
1975.11.26 |
申请人 |
IBM CORPORATION |
发明人 |
ABBAS, SHAKIR AHMED;DOCKERTY, ROBERT CHARLES |
分类号 |
H01L21/283;H01L21/28;H01L21/314;H01L21/76;H01L21/8247;H01L29/41;H01L29/43;H01L29/51;H01L29/78;H01L29/788;H01L29/792;(IPC1-7):B05D5/12 |
主分类号 |
H01L21/283 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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