发明名称 METHOD AND APPARATUS FOR POLISHING SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To obtain a polishing apparatus for a semiconductor device, capable of reducing erosion at the time of polishing. SOLUTION: This polishing apparatus for polishing a wafer 11 comprises, a carrier 10 which is composed of a porous substance capable of permeating a liquid body to be supplied to a back face and has a backing plate 12 for flatly retaining the wafer 11, a liquid body supply route 14 for supplying a liquid body 16 of which a temperature is adjusted so as to cool the back face of the wafer to the face of the backing plate 12 through a rotary shaft 13 of the carrier 10, and a liquid body discharge route 15 for discharging a liquid body 17 which permeates the backing plate 12 and is supplied to the back face of the wafer to the outside of the carrier.
申请公布号 JP2000228377(A) 申请公布日期 2000.08.15
申请号 JP19990028719 申请日期 1999.02.05
申请人 MATSUSHITA ELECTRONICS INDUSTRY CORP 发明人 HAMANAKA MASASHI
分类号 B24B37/015;H01L21/304 主分类号 B24B37/015
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