发明名称 RADIOMETRIC MEASURING DEVICE FOR THE THICKNESS OF COATINGS ON METAL STRIPS
摘要 The measurement error caused by fluttering of the web of material to be measured is compensated in the present invention in the following way: A comparison of the actual separation value and the desired separation value is undertaken in an addition stage (3). The result of the comparison is rectified. After the rectification, the formation of a temporal mean of the rectified half-waves is performed. This mean is then evaluated in a further stage (12) using a parabolic function, and is finally recombined as correcting quantity in a second addition stage with the actual value, supplied by the radiometric measuring device, for a coating thickness control system.
申请公布号 ZA8200244(B) 申请公布日期 1982.11.24
申请号 ZA19820000244 申请日期 1982.01.14
申请人 FAG KUGELFISCHER SCHAEFER G & CO 发明人 SPITZBARTH W
分类号 G01B15/02 主分类号 G01B15/02
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