Quartz oscillator temperature sensor

摘要

A quartz oscillator temperature sensor which measures temperature based on the change in resonance or oscillation frequency of a quartz oscillator with the change in temperature the oscillator can be constructed by cutting a piece of quartz from a wafer with a thickness of about 80 to 150 mu m by rotating the plane of the crystal defined by the electrical and mechanical axes 15 DEG to 25 DEG about the electrical axis and then forming the wafer into a quartz tuning fork. The tuning fork is housed in a case sealed with a stem and coupled to electrical leads with heat resistent solder formed with more than about 90 wt % Pb and less than 10% Sn. The area within the case should be at a substantially high vacuum.