发明名称 |
SEMICONDUCTOR RADIATION DETECTOR AND INDUSTRIAL X-RAY CT EQUIPMENT USING THE SAME |
摘要 |
PROBLEM TO BE SOLVED: To prevent or suppress deterioration of a characteristic of a semiconductor radiation detector when industrial X-ray CT equipment, and the semiconductor radiation detector arranged in it are used for as long time as five to ten years. SOLUTION: The semiconductor radiation detector is provided with a semiconductor crystal having an electrode and a substrate on which the semiconductor crystal is arranged. A crystal face protection means is disposed by leaving an interval from a face except for a face where the electrode of the semiconductor crystal is installed among outer surfaces constituting the semiconductor crystal. Deterioration of the characteristic of the semiconductor radiation detector is suppressed according to the present invention. COPYRIGHT: (C)2008,JPO&INPIT
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申请公布号 |
JP2008227117(A) |
申请公布日期 |
2008.09.25 |
申请号 |
JP20070062753 |
申请日期 |
2007.03.13 |
申请人 |
HITACHI LTD |
发明人 |
KAMIMURA HIROSHI;NUKAGA ATSUSHI |
分类号 |
H01L31/09;A61B6/03;G01T1/24;H01L31/02 |
主分类号 |
H01L31/09 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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