发明名称 |
Semiconductor structure and manufacturing method thereof |
摘要 |
A semiconductor structure includes a semiconductor substrate; a gate stack on the semiconductor substrate; and a stress memorization technology (SMT) sidewall spacer over a sidewall of the gate stack. The gate stack includes a gate dielectric layer over the semiconductor substrate and a gate electrode over the gate dielectric layer. The SMT sidewall spacer provides a stress for a channel region beneath the gate stack. |
申请公布号 |
US9368627(B2) |
申请公布日期 |
2016.06.14 |
申请号 |
US201414483806 |
申请日期 |
2014.09.11 |
申请人 |
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD. |
发明人 |
Liu Ping-Chung;Hung Wei-Chiang;Tsai Hsiang-Yu;Chang Kuo Hui |
分类号 |
H01L21/336;H01L29/78;H01L29/423;H01L29/66;H01L21/283;H01L21/324;H01L21/311;H01L21/302;H01L21/31;H01L21/265;H01L21/8238 |
主分类号 |
H01L21/336 |
代理机构 |
WPAT, P.C., Intellectual Property Attorneys |
代理人 |
WPAT, P.C., Intellectual Property Attorneys ;King Anthony |
主权项 |
1. A method for manufacturing a semiconductor structure, comprising:
forming a gate stack over a semiconductor substrate and a source/drain region adjacent to the gate stack; forming a capping layer over the gate stack and the semiconductor substrate; implanting ions on the capping layer; annealing the capping layer and the semiconductor substrate so as to recrystallize and deform a gate electrode of the gate stack, wherein the deformed gate electrode transfers the stress into a channel region beneath the gate stack; and removing a portion of the capping layer, thereby forming a sidewall spacer around the gate stack. |
地址 |
Hsinchu TW |