发明名称 Semiconductor structure and manufacturing method thereof
摘要 A semiconductor structure includes a semiconductor substrate; a gate stack on the semiconductor substrate; and a stress memorization technology (SMT) sidewall spacer over a sidewall of the gate stack. The gate stack includes a gate dielectric layer over the semiconductor substrate and a gate electrode over the gate dielectric layer. The SMT sidewall spacer provides a stress for a channel region beneath the gate stack.
申请公布号 US9368627(B2) 申请公布日期 2016.06.14
申请号 US201414483806 申请日期 2014.09.11
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD. 发明人 Liu Ping-Chung;Hung Wei-Chiang;Tsai Hsiang-Yu;Chang Kuo Hui
分类号 H01L21/336;H01L29/78;H01L29/423;H01L29/66;H01L21/283;H01L21/324;H01L21/311;H01L21/302;H01L21/31;H01L21/265;H01L21/8238 主分类号 H01L21/336
代理机构 WPAT, P.C., Intellectual Property Attorneys 代理人 WPAT, P.C., Intellectual Property Attorneys ;King Anthony
主权项 1. A method for manufacturing a semiconductor structure, comprising: forming a gate stack over a semiconductor substrate and a source/drain region adjacent to the gate stack; forming a capping layer over the gate stack and the semiconductor substrate; implanting ions on the capping layer; annealing the capping layer and the semiconductor substrate so as to recrystallize and deform a gate electrode of the gate stack, wherein the deformed gate electrode transfers the stress into a channel region beneath the gate stack; and removing a portion of the capping layer, thereby forming a sidewall spacer around the gate stack.
地址 Hsinchu TW