发明名称 METHOD FOR CALIBRATING DITHER MATRIX BASED ON DOT MODEL CONSIDERING OVERLAPPING OF INK
摘要 PURPOSE: A method for correcting the dither matrix is provided to sufficiently reproduce an original image by adjusting threshold value according to the calculating result after correctly calculating the overlapping of ink per dot model. CONSTITUTION: The method has the steps of:sequentially setting to a black from a pixel that has the minimum threshold value, by masking with the dither matrix after optionally deciding a white pixel matrix that has the same size as the dither matrix; reflecting the position relation with around pixels based on the preset dot model, whenever adding a pixel that is set to the black in the white pixel matrix, and calculating equivalent ink amount that is actually printed, at the same time; and renewing the corresponding threshold value of the dither matrix by calculating a correcting threshold value.
申请公布号 KR20000010424(A) 申请公布日期 2000.02.15
申请号 KR19980031324 申请日期 1998.07.31
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KIM, JI HYUNG
分类号 B41J2/00;(IPC1-7):B41J2/00 主分类号 B41J2/00
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