发明名称 CONVEYANCE DEVICE OF ELECTRONIC COMPONENTS, AND INSPECTION DEVICE OF ELECTRONIC COMPONENTS
摘要 PROBLEM TO BE SOLVED: To provide a conveyance device of electronic components and an inspection device of electronic components capable of improving productivity of electronic components by enhancing the speed of inspection of electronic components. SOLUTION: A conveyance part 40 is provided with a conveyance body 42 and a camera 46. The conveyance body 42 has two or more chucks 44 which grasp an electronic component 3. The electronic components 3 are conveyed as grasped by each chuck 44. The camera 46 is arranged in the conveyance body 42. Each electronic component 3 is imaged respectively by moving the camera synchronizing with the conveyance body 42. By this way, the image data imaged for making a quality judgment of each electronic component 3 are acquired by means of non-contact with each electronic component 3. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2007220752(A) 申请公布日期 2007.08.30
申请号 JP20060037074 申请日期 2006.02.14
申请人 TDK CORP 发明人 KADOWAKI SHINICHI;KITAJIMA YASUHIKO;ITO HIROAKI;YAMAZAKI MITSUGI
分类号 H01F41/04;H01F41/00 主分类号 H01F41/04
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