发明名称 Signal generation circuit of semiconductor testing apparatus
摘要 A signal is generated according to the waveform information designated by a program and outputted by the format channels 1 and 2. Skew correction circuits 51 to 54 are provided corresponding to the format channel 1 and 2, and the signal outputted from the corresponding format channel is used as the reference, and the skew of the signal outputted from the other format channel is corrected. Logical add circuits 61 to 64 are provided corresponding to the skew correction circuits 51 to 54, and compose the signal from the corresponding skew correction circuit and the signal from the format channel to which this skew correction circuit corresponds.
申请公布号 US6477668(B1) 申请公布日期 2002.11.05
申请号 US20000576095 申请日期 2000.05.22
申请人 ANDO ELECTRIC CO., LTD. 发明人 ITO KIYOSHI
分类号 G01R31/28;G01R31/3183;G01R31/319;G01R31/3193;(IPC1-7):G06K5/04 主分类号 G01R31/28
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